Description
by
Simon Zabler (Guest Editor)
The intent of this Special Issue is to provide a framework with which scientists in several different disciplines, related to phase-contrast and dark-field imaging, can illustrate their ideas and results. The articles are reviews or very recent scientific reports; they address newcomers in the field, as well as experts and professors in fields of X-ray physics, electron, and phase-contrast X-ray imaging.
Number of Pages: 146Dimensions: 0.4 x 9.61 x 6.69 INIllustrated: YesPublication Date: January 08, 2019
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